5 results
SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2319-2320
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1437-1438
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 13-14
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1859-1860
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
SIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 966-967
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation